Aehr Test Systems is a worldwide supplier of semiconductor test and burn-in equipment.

Aehr Test Systems

Aehr Test Systems provides test systems for burning-in and testing logic, optical, and memory integrated circuits worldwide. It offers products, such as the ABTS and FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX-XP WaferPak Contactor, FOX DiePak Carrier, and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for lower power and higher power logic devices, as well as various common types of memory devices. The FOX-XP and FOX-NP systems are wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a single-wafer compact test and reliability verification solution for logic, memory, and photonic devices. The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform final test and burn-in of bare die and modules. Aehr Test Systems was incorporated in 1977 and is headquartered in Fremont, California.

Aehr Test Systems is a worldwide supplier of systems for testing and burning-in logic, memory, photonic, power devices and SiC wafers with an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS, FOX and MAX systems and the DiePak® carrier. The FOX system a full wafer contact, bare die and module test and burn-in system. The Fox system is the leader in SiC wafer testing. The FOX system utilizes a WaferPak Contactor to contact wafers and DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die or modules. 

COM:AEHR

Aehr Test Systems

Last Close

12.55

12/11 19:39

Market Cap

445.00M

Beta: -

Volume Today

626.03K

Avg: -

locale

market

industry

website

crunchbase

linkedin

founding date

ipo date

Metrics